NIST and CHIPS request comments on the draft of Special Publication 1000-2 ipd, Building a Metrology Exchange to Innovate in Semiconductors (METIS). This publication presents the vision for ensuring that the direct results of federally funded scientific research under the CHIPS Metrology Program are made available to and useful for the public, industry, and the scientific community. The dissemination and exchange of data, models, and other data products convey the outcomes of world-leading microelectronics research to the marketplace, enabling and supporting America's security and commercial competitiveness.
NIST CHIPS Special Publication 1000-2, Building a Metrology Exchange to Innovate in Semiconductors (METIS), outlines the vision for a data exchange ecosystem that provides stakeholders with access to CHIPS Metrology research results. This vision describes the functionality of METIS and how it may be used.
